Equipment&Charges

Microstructural Characterization (Institute for Materials Research/The Electron Microscopy Center)
■Technical support charge: 3,300 yen/hour
■Sample preparation room:330yen/hour
Equipment usage Charges【yen/day(8hours)】
Equipment nameOpen ProjectClassified Project
SU8000,S-550014,08072,160
Titan80-30036,080 106,480
FEI-Titan G2-cubed46,640121,440
FEI-Titan G2-cubed50,160125,860
※All charges listed here are including tax.
Microstructural Characterization (Analytical Research Core for Advanced Materials)
■Technical support charge:
Open project:3,300 yen/hour
Classified Project:6,600yen/hour
Equipment usage Charges【yen/day(8hours)】
Equipment nameOpen ProjectClassified Project
JEM-ARM200F30,800163,680
Topcon EM-002B25,52051,920
JEOL JEM-2000EXII16,72034,320
FIB-SEM(Quanta 3D)30,36062,920
FIB-SEM(Versa 3D)30,36062,920
JEOL EM-09100IS17,60032,560
PIPSII9,68022,880
Model10103,52013,200
X-ray Diffractometer6,16032,560
Thermoanalysis5,28012,320
※ All charges listed here are including tax.
Microstructural Characterization (Research and Analytical Center for Giant Molecules)
Equipment usage Charges【yen/day(8hours)】
Equipment nameOpen ProjectClassified Project
Nuclear magnetic resonance (NMR)5,20032,100
ICP optical emission spectrometer3,2004,600
・Raw chemicals for syntheses are not included.
・All charges listed here are including tax.
Nanofabrication(MEMS)
【Open Project】
■Technical support fee: 3,300 yen/hour  
■Facility usage charge: 960 yen/hour(790 yen/hour for the use within the Universityr )

【Classified Project】
■Technical support fee: 6,514 yen/hour  
■Facility usage charge: 960 yen/hour(790 yen/hour for the use within the Universityr )
No.Equipment nameOpen PClassified PNo.Equipment nameOpen PClassified P
A.Cleaning & drying
A-1Draft chamber1,290 1,548 A-7Spin-drying machine2,428 2,914
A-2Draft chamber for SiN etching1,730 2,076 A-8Organic draft chamber1,290 1,548
A-4Inert oven for sintering1,710 2,052 A-94" spin drying machine2,612 3,134
A-5Vacuum oven994 1,192 A-106"spin drying machine2,612 3,134
A-6Brush scrubber6,906 8,286     
B.Photolithography
B-2Spin coater2,170 2,604 B-13Elionix EB lithography9,422 11,306
B-3Clean oven2,830 3,396 B-14Laser writer7,094 8,512
B-4Curing oven1,872 2,246 B-15Maskless exposure system for ball4,450 5,340
B-5Double-side aligner3,240 3,888 B-16Spin dryer2,208 2,650
B-8Draft chamber for development1,290 1,548 B-17Hot plate994 1,192
B-9UV curing4,120 4,944 B-18maskless aligner5,374 6,450
B-10Spin coater2,332 2,798 B-19i-line stepper14,960 29,700
B-11Spray developer2,156 2,588 B-20Coater developer6,458 13,200
C.Oxidation/diffusion, ion injection and heat treatment
C-1Oxidation furnace (for semiconductors)) 10,598 12,716 C-7Annealing furnace10,112 12,134
C-2Oxidation furnace (for MEMS)9,168 11,000 C-8Medium-current ion injector19,934 23,922
C-3P diffusion furnace11,562 13,874 C-10Rapid thermal annealing8,522 10,226
C-4P push-in furnace9,854 11,824 C-11Metal diffusion furnace7,856 9,426
C-5B diffusion furnace10,938 13,126     
C-6B push-in furnace9,854 11,824     
D.Deposition
D-1LPCVD(SiN) 12,108 14,530 D-12MOCVD19,484 23,382
D-2LPCVD(Poly-Si)11,838 14,206 D-13JPEL PECVD15,156 18,188
D-3LPCVD(SiO2) 12,808 15,368 D-14TEOS PECVD16,904 20,286
D-4CVD 21,326 25,590 D-15Automatic Shibaura

sputtering
6,524 7,828
D-5SUMITOMOSEIMITU PECVD 15,350 18,420 D-16Sputtering for ball4,392 5,270
D-6W-CVD 9,818 11,782 D-17ALD10,418 12,502
D-7ANELVA sputtering equipment8,588 10,306 D-18High-temp. sputtering and O2 annealing11,698 14,038
D-8SHIBAURA sputtering equipment3,758 4,510 D-20ECR long-throw sputter6,450 7,740
D-9Electron beam evaporator6,838 8,206 D-21SPP Technologies TEOS PECVD16,770 21,507
D-10Sol-gel auto-deposition system8,066 9,680     
D-11Plating equipment2,534 3,040    
E.Etching
E-1DeepRIE #18,054 9,666 E-12TMAH etching equipment3,112 3,734
E-2DeepRIE #2 8,054 9,666 E-13DeepRIE #414,770 17,724
E-3DeepRIE #3 8,278 9,934 E-14Ion milling11,360 13,632
E-4ANELVA RIE equipment 7,078 8,494 E-15Vapor HF etching8,534 10,240
E-5ANELVA Si RIE equipment6,346 7,616 E-16Ulvac ICP-RIE#115,970 19,166
E-6Al-RIE11,912 14,294 E-17Chemical Dry Etcher (CDE)5,976 7,172
E-7ULVAC ashing equipment4,066 4,880 E-18Plasma cleaner3,198 3,838
E-8BRANSON ashing equipment3,316 3,980 E-19Ulvac ICP-RIE#215,684 18,820
E-10ULVAC multi-purpose RIE equipment10,902 13,082     
E-11KOH etching equipment3,100 3,722     
F.Bonding, polishing and packaging
F-1Wafer bonding equipment5,946 7,134 F-9EVG wafer bonder6,112 7,336
F-2TOKYO SEIMITSU dicer9,656 11,588 F-10EVG aligner for wafer bonding5,302 6,362
F-3DISCO dicer2,646 3,176 F-11UV imprint6,638 7,964
F-4Wire bonder1,186 1,424 F-12Thermal imprint5,900 7,080
F-5Laser marker2,436 2,922 F-13Excimer lamp cleaner2,700 3,240
F-66-inch wafer polishing equipment2,120 2,544 F-14Surface planer14,974 17,968
F-74-inch wafer polishing equipment1,822 2,186 F-15Shibuya LAMICS AQL-19008,018 9,622
F-8Sand blast3,418 4,102
G.Measurement
G-1Wafer dust detector1,976 2,372 G-15Ultrasonic microscope2,284 2,742
G-2Film thickness gage1,384 1,662 G-16Digital thermo microscope1,248 1,496
G-3Dektak step profiler1,658 1,990 G-17Infrared microscope1,236 1,482
G-4Tenchor step profiler1,658 1,990 G-18Quadrupole mass analyzer1,226 1,472
G-5Depth measuring equipment1,074 1,290 G-20Quick coater1,338 1,606
G-64-probe measuring equipment1,076 1,290 G-22Desktop Ellipsometer746 896
G-7Spreading resistance profiler2,616 3,140 G-24Laser/white light conforcal microscope4,728 5,674
G-8Wafer prober2,666 3,198 G-25Line-focus-beam acoustic microscope for material characterization #13,488 4,184
G-9Metal microscope1,152 1,382 G-26Line-focus-beam acoustic microscope for material characterization #23,488 4,184
G-10Digital microscope1,540 1,848 G-27FIB9,596 11,516
G-11Thermal electron SEM2,632 3,158 G-28XRD5,154 6,184
G-12FE-SEM 4,622 5,546 G-29JEOL FE-SEM5,330 6,396
G-13Micro X-ray CT3,324 3,988     
G-14Ellipsometer972 1,166     
※Nanofabrication:All charges listed here are including tax.